Articolul „A metamodel-based adaptive sampling approach for efficient failure region characterization of integrated circuits”, autori Ingrid Lupou Kovacs, Marina Țopa, Monica Ene, Andi Buzo, Georg Pelz , acceptat la conferința IEEE DCIS2020 (XXXV Conference on Design of Circuits and Integrated Systems

de | 19 septembrie 2020
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Ingrid Lupou Kovacs, Marina Țopa, Monica Ene, Andi Buzo, Georg Pelz – „A metamodel-based adaptive sampling approach for efficient failure region characterization of integrated circuits”, acceptat la conferința IEEE DCIS2020 (XXXV Conference on Design of Circuits and Integrated Systems